Aberration-corrected Microscopy - Volume 153, Advances in Imaging and Electron Physics
Peter-W HawkesDate de parution
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing Imaging single atoms using secondary electrons …
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Advances in Imaging and Electron Physics | … Advances in Imaging and Electron Physics. Edited by Peter W. Hawkes. Volume 168, Pages 1-373 (2011) Download full volume. Previous volume. Next volume. Actions for selected chapters. Select all / Deselect all. Download PDFs Export citations. Show all chapter previews Show all chapter previews. Receive an update when the latest chapters in this book series are published. Sign in to set up
Advances in Imaging and Electron Physics, Volume … Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures (approximately 2000 degrees C
Advances in Imaging and Electron Physics, Volume 177. ISSN 1076-5670, ... structure. Aberration correction in TEM highly enhances the spatial resolution. Advances in Imaging and Electron Physics Volume 153 [2008]. Aberration- corrected ... New possibilities with aberration-corrected electron microscopy [ 2009].
Advances in Imaging and Electron Physics by …